Maximum-information photoelectron metrology

Quality Information Framework – Integrating Metrology Processes

As defined by major dimensional metrology system users and suppliers, the Quality Information Framework (QIF) is an integrated and holistic set of information models which, if widely adopted, can enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process – from design to planning to execution to analysis. This paper introduces the philosophy ...

Applicability of Metrology to Information Technology

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001, In 1959 the Director of the National Bureau of Standards declared “The emergence of science and technology as the paramount concern of the Nation in the 20 century . . . demanded the highest order of measurement competence, in order to provide the standards and measurement techniques on which maintenance of scientific ...

Quantum metrology from an information theory perspective

Questions about quantum limits on measurement precision were once viewed from the perspective of how to reduce or avoid the effects of quantum noise. With the advent of quantum information science came a paradigm shift to proving rigorous bounds on measurement precision. These bounds have been interpreted as saying, first, that the best achievable sensitivity scales as 1/n, where n is the numbe...

Heisenberg-limited metrology with information recycling

(2015) Heisenberg-limited metrology with information recycling. This document is made available in accordance with publisher policies and may differ from the published version or from the version of record. If you wish to cite this item you are advised to consult the publisher's version. Please see the URL above for details on accessing the published version. Copyright and all moral rights to t...

Power of One Bit of Quantum Information in Quantum Metrology